Scanning electron microscopeScanning electron Microscope
Overview
A scanning electron microscope with an energy dispersive elemental analyzer. As for image observation, secondary electron images and backscattered electron images can be observed, and samples ranging from powdery to mechanical parts with a height of 8 cm and a diameter of 17 cmΦ can be observed. For elemental analysis, the target is usually an element with an atomic number greater than that of oxygen. The operation is relatively easy, and even a beginner can observe images after taking a few lessons. EBSD observation is also possible for samples with smooth surfaces.
Name (abbreviation) | Scanning electron microscope(SEM) |
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Model number (manufacturer) | JSM-6490 (JEOL) |
Magnification | x5~300000 |
Resolution | 8nm |
Irradiation current | ~1μA |
Installation location | B1 building 1st floor room ⑯ |
Equipment manager | Department of Chemistry Yasushi Sato |
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