Fully automatic multi-purpose X-ray diffractometerAutomated Multipurpose X-ray diffractometer with guidance softwar

Exterior

Mount

Optional mount

Overview

This system is a fully automatic multi-purpose X-ray diffractometer that can be applied not only to conventional crystal structure analysis of powder samples, but also to diversifying analysis needs (nanostructure, residual stress, thin film, texture orientation distribution, etc.). Powder X-ray diffractometry uses a high-power X-ray source and a highly sensitive multidimensional semiconductor detector to obtain higher-quality diffraction patterns than conventional equipment, enabling highly accurate crystal structure analysis. is. In addition, this device has the feature that various attachments can be installed on the sample table, and nanostructure (small angle scattering measurement), film thickness and in-plane structure of thin film (thin film X-ray diffraction, reciprocal lattice mapping, in-plane Plane/reflectance measurement), residual stress of structural materials (stress measurement), texture orientation distribution of metal composite materials (polar point measurement), etc. In addition, as a measurement option, high-temperature measurement of powder X-ray diffraction and diffraction measurement in a minute area are also possible.