Fluorescence lifetime measurement deviceFluorescence Lifetime Measurement Apparatus
Overview
A pulsed laser beam (wavelength about 400 nm) is irradiated, and the light emitted from the sample is emitted at multiple wavelengths (35-130 nm range) between the excitation wavelength and 800 nm at high speed (every 2 × 10-12 seconds to 10-6 seconds). Measure and transfer the measurement data to a computer. The half-life of the luminescence of the sample can be obtained by analyzing the time change of the luminescence intensity with a computer. A spectrum is also measured at the same time, and a time change of the spectrum on the order of 10-9 to 10-6 seconds is also obtained. It is also possible to create a three-dimensional diagram of the time/wavelength dependence of luminescence intensity. Even in the case of non-single-exponential decay, parameters such as reaction rate constants can be obtained by computer analysis. For example, it is also possible to determine the energy or electron transfer speed from the phosphor to the receptor.
Name (abbreviation) | Fluorescence lifetime measurement device(TSUNAMI) |
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Model number (manufacturer) | Tsunami 3960/50-M2S(Spectra-Physics) |
Overview | Semiconductor excitation Nd:YVO4レーザー(Spectra-Physics Millennia-V) Ti:Sapphireレーザー(Spectra-Physics Tsunami 3960/50-M2S) 2nd harmonic generator(Spectra-Physics 3980-6S) Diffraction grating controller(Hamamatsu C5094) Streak camera(Hamamatsu C4334) |
Installation location | Room A3, 2nd floor, ⑥ |
Equipment manager機器責任者 | Department of Bio and Applied Chemistry Makoto Takezaki |
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