Scanning electron microscopy-cathodoluminescence
OutlineOutline
Cathodoluminescence (CL) microscopy and spectroscopy provide valuable information on the existence and distribution of lattice defects and trace elements in materials with a spatial resolution of a few micrometers. This information is otherwise quite difficult to obtain using other analytical methods. The CL properties such as color, intensity, and spectral-peak features depend on the nature of defect and impurity centers, their concentrations, chemical composition and structure of host crystal, and the crystal fields in materials, which are closely related to crystallization temperature, pressure and temperature conditions. This instrument has been extensively used for crystal chemical investigation of various materials including minerals, fossils and ceramics.
PerformancePerformance
| Name (abbreviation) | Scanning electron microscopy-cathodoluminescence （SEM-CL） |
| Model number (manufacturer) | SEM (Jeol JSM-5400) combined with a monochromator (Oxford Mono CL2) |
| Accelerating voltage, Radiation current: | 5-20 kV, 0.1-5 nA |
| Magnification | x50,000 |
| Space resolution | 1 μm |
| Samples | Minerals, Ceramics, Semiconductors and other inorganic materials |
| Installation location | C3-bilg, 2nd-fl, No.9 |
| Equipment manager | Kazumasa Aoki, Center for Fundamental Education |
| Contact us | Contact form is open 24 hours a day. Contact by telephone: Direct 086-256-8473 ext.3242 |
