Ultra High Resolution Field Emission Scanning Electron Microscopes
OutlineOutline
The apparatus is a ultra high resolution field emission scanning electron microscopes (FE-SEM) with an energy dispersive X-ray spectroscopy (EDX) that can be obtained SEM image of 500,000x magnification. The image observation, it is possible to observe the secondary electron image and the backscattered (reflected) electron image, the elemental mapping image can also be obtained. Observable samples are the size of the height 8mm and diameter within 5 cm. Operation is easy, for the image observation, it is possible to observe if you take several technical trainings even beginners.
PerformancePerformance
| Name (abbreviation) | Ultra High Resolution Field Emission Scanning Electron Microscopes（Fe-SEM ） |
| Model number (manufacturer) | SU8010（Hitachi High-Technologies） |
| Resolution | 1nm (Secondary Electron Image) |
| Landing voltage | 0.5～30Kv |
| Magnification | 30～500.000倍 |
| Installation location | Room⑥, 2nd floor, Building C3 |
| Equipment manager | Prof. Tatsuyuki Nakatani |
| Contact us | Contact form is open 24 hours a day. Contact by telephone: Direct 086-256-8473 ext.3242 |
