Automated Multipurpose X-ray diffractometer with guidance softwar
OutlineOutline
X-ray diffraction (XRD) is widely used to characterize various crystalline materials. This technique provides information on crystal structures, phases, preferred crystal orientations, average grain size, crystallinity, strain, and so on. Rigaku SmartLab is novel high-resolution X-ray diffractometer equipped with a high-flux 9 kW rotating anode X-ray source, fully-automated switchable reflection & transmission optics and high-energy-resolution semiconductor detector with 0, 1 and 2D modes. In the case of conventional powder XRD measurement, it is possible to obtain diffraction patterns with high intensity and high resolution. In addition, this equipment provides some information about powder diffraction at high temperature, small angle X-ray scattering, thin film and in-plane scattering, reciprocal lattice mapping and residual stress and micro-area measurements.
PerformancePerformance
Name (abbreviation) | Automated Multipurpose X-ray diffractometer with guidance softwar(SmartLab) |
Model number (manufacturer) | SmartLab (Rigaku) |
X-ray source | High-flux 9 kW rotating anode X-ray source (PhotoMax) |
Detector: | High-energy-resolution semiconductor detector with 0, 1 and 2D modes (HyPix-3000) |
Installation location | Room ④ 2nd floor, Building A3 |
Equipment manager | Administrator: Yasushi Sato, Department of Chemistry, Faculty of Science |
Contact us | Contact form is open 24 hours a day. Contact by telephone: Direct 086-256-8473 ext.3242 |