Transmission electron microscope
OutlineOutline
The JEM 2800 has both secondary and transmission electron imaging modes that enable us to get scanning transmission electron microscopic images (STEM-BF and HAADF-STEM images) and secondary electron image (SEI) with easy operations. This microscopy is equipped with an energy-dispersive X-ray spectroscope (EDS) that allows us to analyze elemental composition of the samples.
PerformancePerformance
| Name (abbreviation) | Field emission transmission electron microscope（FE-STEM） |
| Model number (manufacturer) | JEM-2800 （JEOL） |
| Gun | Schottky emission |
| Acceleration voltage | 200kV, 100kV |
| Resolution | 0.1nm (TEM), 0.2nm (STEM), 0.5nm (SEI) |
| EDS Detector | Silicon Drift Detector (SDD, 100mm2) |
| Sample holder | Double-tilt berylliumholder and double-tilt cooling holder (LN2) |
| Installation location | Electron microscope room ② (West of building C3) |
| Equipment manager | Department of Biotechnology and Applied Chemistry yoshihiro Kusano |
| Contact us | Contact form is open 24 hours a day. Contact by telephone: Direct 086-256-8473 ext.3242 |
