Electron Prove Microanalyzer
OutlineOutline
The JXA-8230 allows quantitative element analysis of micro- spot (μm order) with observation of electron microscope images (SEM). The accelerated electron beam irradiates the specimen to generate characteristic X-rays, secondary electrons, backscattered electrons, and cathodoluminescence. The JXA-8230 detects these signals performing color element mapping in both micro- and macro-size areas. Qualitative and semi-quantitative analysis using the energy dispersive spectrometer (EDS) are simple and the results can be obtained in real time. Since the position reproducibility is good, the user can perform easily a large amount of quantitative analysis using the preset analytical position and the saved analytical condition.
PerformancePerformance
| Name (abbreviation) | Electron Prove Microanalyzer（WDS） |
| Model number (manufacturer) | JXA-8230 （JEOL） |
| Detectable element range | 5B～92U |
| Accelerating voltage | 0.2～30kV |
| Secondary electron image resolution | 6nm |
| Maximum magnification | ×300,000 |
| Observation images | SEI、BSI、OM、COMPO、CL |
| Installation location | Room ⑤, 2nd floor, Building C3 |
| Equipment manager | IFST Takeshi Imayama |
| Contact us | Contact form is open 24 hours a day. Contact by telephone: Direct 086-256-8473 ext.3242 |
